Force controlled pushing of nanoparticles: modeling and experiments

摘要

A nano-robotics manipulation system using an atomic force microscope (AFM) probe as the pushing manipulator and a force and topology sensor has been proposed. The task is the 2D positioning of nanometer size particles on a substrate in ambient conditions. Thus, the modeling of interaction forces and dynamics during the pushing operation is analyzed for understanding the nano scale physical phenomenon which is different from macro robotics physics. Simulations and experiments are held for determining the conditions and strategy for reliable manipulation, and determining the affecting parameters. The results show that latex particles can be positioned on silicon substrates successfully.