Ryusuke Nebashi

About

Ryusuke Nebashi is a leading researcher in nonvolatile programmable logic and resistive-switching technologies, with a focus on atom switches and NanoBridge-based field-programmable gate arrays (FPGAs). His work addresses critical challenges in high-temperature and robust electronics, particularly for aerospace, automotive, and industrial applications. Nebashi’s major contributions include the development of a NanoBridge-based FPGA that operates reliably in high-temperature environments, achieving a high on/off conductance ratio and weak temperature dependence—a key advance for BEOL-integrated nonvolatile logic. His most-cited paper (9 citations) demonstrates this FPGA’s resilience, while his second-most-cited work (6 citations) introduces a robust Cu atom switch with an over-400°C thermally tolerant polymer-solid electrolyte (TT-PSE). By selectively eliminating weak hydrocarbon bonds in the PSE, Nebashi achieved unprecedented thermal stability, enabling standard Cu-BEOL compatibility. These innovations have positioned him as a pioneer in nonvolatile programmable logic, with potential to revolutionize reconfigurable computing in extreme conditions. His research continues to influence the design of energy-efficient, radiation-hardened electronics, making him a key figure in the evolution of next-generation logic devices.

Research Focus

Key Achievements

Top Papers

1. 1
   NanoBridge-Based FPGA in High-Temperature Environments

   9 citations · 2017
2. 2
   Robust Cu atom switch with over-400°C thermally tolerant polymer-solid electrolyte (TT-PSE) for nonvolatile programmable logic

   6 citations · 2016

Key Collaborators

Contact & Links