Cerine Mokhtari

Centre National de la Recherche Scientifique

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About

Cerine Mokhtari is a researcher at the forefront of microwave and millimetre-wave metrology, with a focus on advancing automated characterization techniques for next-generation electronic devices. Her primary research areas include on-wafer probing, nanorobotics, and high-frequency measurement repeatability. Mokhtari’s most notable contribution is the development of an automated and robotic on-wafer probing station, which addresses critical challenges in calibration and measurement accuracy for emergent millimetre-wave technologies. By integrating hardware and software innovations, her work enhances the repeatability and reliability of on-wafer measurements—a key bottleneck in the characterization of advanced semiconductor devices. Her 2023 paper on this topic has garnered 4 citations, reflecting its growing relevance in the field. Mokhtari’s research bridges robotics and high-frequency metrology, offering practical solutions for industry and academia alike. Her achievements highlight a commitment to precision engineering, positioning her as an emerging voice in the drive toward fully automated, high-accuracy characterization platforms for the next generation of wireless and sensing technologies.