Soft error high speed correction by interruption scrubbing method in FPGA for embedded control system

Abstract

This paper presents a Configuration RAM (CRAM) diagnosis macro achieving high-speed detection and correction of neutron-induced soft errors in static random access memory (SRAM)-type field-programmable gate arrays (FPGAs), and the design methodology for control systems requiring safety and availability with our proposed diagnosis macro. We developed a handstand-type robot controlled by an SRAM-type FPGA distributed by Xilinx <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">®</sup> which we applied to our proposed macro in order to evaluate its effectiveness. The results of a neutron irradiation test showed that the failure rate of our developed robot is about 64,580 years/system, equivalent to that of 1.78 FIT.