John Njagi
Papers
1
Total Citations
8
H-Index
1
About
John Njagi is a materials scientist whose research focuses on the electrical characterization of thin films and nanostructured materials, particularly for applications in electronic interconnects and conductive composites. His most notable contribution is the development of a novel electrical four-point probing technique specifically designed to measure the intrinsic resistivity of spherical metallic thin films coated onto micron-sized polymer particles—a critical advancement for the field. Prior to his work, the contact resistance between the probe and the curved surface of these particles made accurate measurements impossible. By eliminating this contact effect, Njagi’s method, detailed in his 2016 paper (cited 8 times), provides a reliable pathway to optimize the conductivity of filler particles used in anisotropic conductive adhesives and other electronic packaging materials. This achievement has direct implications for improving the performance and reliability of flexible electronics and microelectronic interconnects. His work bridges a fundamental gap in metrology, enabling more precise engineering of composite materials.
Research Focus
Key Achievements
Top Papers
- 1