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Fabrication and characterization of microlens arrays using a cantilever-based spotter

Véronique Bardinal, E. Daran, Thierry Leïchlé, C. Vergnenègre, Christophe Levallois, T. Camps, Véronique Conédéra, Jean‐Baptiste Doucet, F. Carcenac, Heidi Ottevaere, Hugo Thienpont

发表年份
2007
引用次数
35

摘要

We present a quantitative study on the fabrication of microlenses using a low-cost polymer dispending technique. Our method is based on the use of a silicon micro-cantilever robotized spotter system. We first give a detailed description of the technique. In a second part, the fabricated microlenses are fully characterized by means of SEM (Scanning Electron Microscope), AFM (Atomic Force Microscopy) non contact optical profilometry and Mach-Zehnder interferometry. Diameters in the range [25-130mum] are obtained with an average surface roughness of 2.02nm. Curvature radii, focal lengths as well as aberrations are also measured for the first time: the fabricated microlenses present focal lengths in the range [55-181mum] and exhibit high optical quality only limited by diffraction behaviour with RMS aberration lower than lambda/14.

关键词

MicrolensOpticsMaterials scienceFocal lengthProfilometerCantileverFabricationScanning electron microscopeSurface roughnessWhite light interferometry

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