Negative-bias temperature instability

Related papers: 1

Top Researchers

Akinori Takeyama

Institution: —

Takahiro Makino

Institution: —

Shuichi Okubo

Institution: —

Yūki Tanaka

Institution: —

Toru Yoshie

Institution: —

Yasuto Hijikata

Institution: —

Takeshi Ohshima

Institution: —

Top Cited Papers

Radiation Response of Negative Gate Biased SiC MOSFETs

Akinori Takeyama, Takahiro Makino, Shuichi Okubo, Yūki Tanaka, Toru Yoshie, Yasuto Hijikata, Takeshi Ohshima

Citations: 19 • 2019

Related Technologies

PhysicsEngineeringElectrical engineeringOpticsMaterials scienceOptoelectronicsTransistorVoltageRadiationMOSFET