R. Sivaratana

Papers

Total Citations

H-Index

About

R. Sivaratana is a researcher in magnetic recording technology, with a specific focus on the characterization and testing of tunneling magnetoresistive (TMR) heads. Their most cited work, "Testing parameters of TMR heads affected by dynamic-tester induced EMI" (2007), examines how electromagnetic interference from dynamic testers can distort key performance parameters in TMR heads, a critical component in high-density data storage. This contribution addresses a practical challenge in hard disk drive manufacturing, helping to improve the reliability and accuracy of head testing processes. While their citation count remains modest at five, the work underscores a niche but essential area of applied physics and engineering. Sivaratana’s research bridges the gap between device physics and industrial testing, offering insights that support the development of more robust magnetic sensors. For students and researchers exploring the intersection of electromagnetic compatibility and storage technology, this work provides a foundational case study in mitigating interference effects during component characterization.