A. Kruesubthaworn

Papers

Total Citations

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About

A. Kruesubthaworn’s research career is defined by a focused expertise in the intersection of electromagnetic interference (EMI) and advanced electronics engineering. Their most cited work, “Testing parameters of TMR heads affected by dynamic-tester induced EMI” (2007, 5 citations), represents a significant contribution to the field of magnetic recording technology. This paper meticulously investigates how dynamic testers introduce EMI that can skew the performance parameters of tunneling magnetoresistive (TMR) heads, offering critical insights for improving testing accuracy and head reliability in data storage applications. Beyond this specialized contribution, Kruesubthaworn has demonstrated a broad commitment to advancing engineering knowledge through editorial leadership. They served as the editor for the 2015 collection “Advanced Engineering Research” (3 citations), a peer-reviewed volume stemming from the International Electrical Engineering Congress (iEECON 2015) in Phuket, Thailand. This compilation of 159 papers spans communication technologies, electronics, and microelectronics, showcasing their role in curating and disseminating cutting-edge research across the electrical engineering spectrum. Kruesubthaworn’s work, while modest in citation count, provides foundational insights into EMI effects and fosters collaborative scientific exchange.