Neal Brock

4D Technology (United States)

Papers

2

Total Citations

17

H-Index

2

About

Neal Brock is a precision metrology researcher whose work focuses on dynamic surface profiling and optical measurement techniques. His primary contributions lie in developing instruments capable of accurately measuring surface roughness even under challenging conditions involving significant vibration or motion. Brock's key innovation integrates a specialized CCD camera with a micro-polarizer array and a proprietary LED source, enabling quantitative measurements with extremely short exposure times. This approach effectively decouples the measurement from environmental disturbances, making it highly valuable for industrial quality control and in-situ manufacturing applications. His most cited work, the "Dynamic surface roughness profiler" (2012), has accumulated 10 citations, while an earlier version from 2011 has received 7 citations. Though his publication record is focused, the consistent citation of this core technology underscores its practical significance and the niche but important impact of his contributions to optical metrology. Brock’s work exemplifies how targeted engineering solutions can overcome fundamental limitations in precision measurement.

Research Focus

Key Achievements

2
H-Index
2
Papers
17
Total Citations
9
Avg Citations/Paper
🏆 Most Cited Paper
Dynamic surface roughness profiler
10 citations · 2012
📈 Most Prolific Year: 2012 (1 Papers)
🤝 Key Collaborators: 2
🏛 Institutions: 4D Technology (United States)

Top Papers

  1. 1
  2. 2

Key Collaborators

Contact & Links

Available for collaboration
Content generated · 14 days ago