Home /Research /Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy
OTHER

Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy

Jos A. Gutierrez, Brian Armstrong

Year
2010
Citations
10

Keywords

LandmarkPhotogrammetryComputer visionArtificial intelligenceComputer scienceProcess (computing)MATLABSoftwareImage processingMachine vision

Related papers

Browse all OTHER papers