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Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0

Marzieh Khakifirooz, Chen–Fu Chien, Ying‐Jen Chen

Year
2017
Citations
87

Keywords

InferenceBig dataYield (engineering)Bayesian inferenceBayesian probabilitySemiconductor industryProduction (economics)Computer scienceSemiconductor device fabricationManufacturing

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