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Bayesian inference for mining semiconductor manufacturing big data for yield enhancement and smart production to empower industry 4.0

Marzieh Khakifirooz, Chen–Fu Chien, Ying‐Jen Chen

发表年份
2017
引用次数
87

关键词

InferenceBig dataYield (engineering)Bayesian inferenceBayesian probabilitySemiconductor industryProduction (economics)Computer scienceSemiconductor device fabricationManufacturing

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