DiTOX: Fault Detection and Localization in the ONNX Optimizer
Nikolaos Louloudakis, Ajitha Rajan
- Year
- 2025
- Access
- Open access
Abstract
The ONNX Optimizer, part of the official ONNX repository and widely adopted for graph-level model optimizations, is used by default to optimize ONNX models. Despite its popularity, its ability to preserve model correctness has not been systematically evaluated. We present DiTOX, an automated framework for comprehensively assessing the correctness of the ONNX Optimizer using differential testing, fault localization, and evaluation techniques that generalize to other compiler optimizers. DiTOX applies optimization passes to a corpus of ONNX models, executes both original and optimized versions on user-defined inputs, and detects discrepancies in behavior or optimizer failures. When divergences are observed, DiTOX isolates the responsible optimization pass through iterative, fine-grained analysis. We evaluated DiTOX on 130 models from the ONNX Model Hub spanning vision and language tasks. We found that 9.2% of model instances crashed the optimizer or produced invalid models under default settings. Moreover, output discrepancies occurred in 30% of classification models and 16.6% of object detection and segmentation models, while text-based models were largely robust. Overall, DiTOX uncovered 15 issues -- 14 previously unknown -- affecting 9 of the 47 optimization passes as well as the optimizer infrastructure. All issues were reported to the ONNX Optimizer developers. Our results demonstrate that DiTOX provides a simple and effective approach for validating AI model optimizers and is readily extensible beyond ONNX.
Keywords
Related papers
How to Relieve Distribution Shifts in Semantic Segmentation for Off-Road Environments
Ji-Hoon Hwang, Daeyoung Kim, Hyung-Suk Yoon +2 more
2026
Uncertainty-guided evolvable recognition framework for industrial robots via prototype-based fuzzy inference and evidence fusion
Yanrun Zhou, Zihao Lei, Guangrui Wen +4 more
Robotics and Computer-Integrated Manufacturing · 2026
Point cloud registration for non-destructive, high-resolution coating thickness measurement from 3D scans
Simon Duenser, Ivo Aschwanden, Raamadaas Krishnadas +2 more
Robotics and Computer-Integrated Manufacturing · 2026
Toward the intelligent robotics era: Multimodal flexible haptic sensors for advanced perception systems
Sili Ding, Feng Xu, Jie Chen +3 more
Progress in Materials Science · 2026