Semi-physical Gamma-Process Degradation Modeling and Performance-Driven Opportunistic Maintenance Optimization for LED Lighting Systems

摘要

Large-scale LED lighting systems degrade through gradual package degradation and abrupt driver outages, while acceptability is determined by spatio-temporal illuminance compliance rather than component reliability alone. This paper proposes a performance-driven, simulation-in-the-loop framework for opportunistic maintenance optimization of LED lighting systems. LED package degradation is modeled by a semi-physical non-homogeneous Gamma process whose mean follows an exponential lumen-maintenance trend, and driver outages are described by a Weibull lifetime model. Parameters are calibrated from LM-80 accelerated degradation data via Bayesian inference, enabling uncertainty propagation to operating conditions. System performance is evaluated using ray-tracing-based illuminance mapping, and static indices (average illuminance and uniformity) are converted into a long-term dynamic deficiency-ratio metric via performance-deficiency durations over event intervals. To enable scalable Monte Carlo policy evaluation and search, a surrogate-based performance mapping replaces repeated ray-tracing with negligible loss of fidelity. An opportunistic policy is optimized in a multi-objective setting to balance performance deficiency, site visits, and replacements. A case study demonstrates the practicality of the framework and the resulting Pareto trade-offs for maintenance decision support.