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Enhanced GO methodology to support failure mode, effects and criticality analysis

Linlin Liu, Dongming Fan, Zili Wang, Dezhen Yang, Jingjing Cui, Xinrui Ma, Yi Ren

Year
2017
Citations
23

Keywords

Failure mode, effects, and criticality analysisFailure mode and effects analysisReliability engineeringReliability (semiconductor)Computer scienceProcess (computing)Bayesian networkCriticalityFault (geology)Function (biology)

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