Single event upset
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最高引用论文
Proton Beam Testing of SEU Sensitivity of M430FR5989SRGCREP, EFM32GG11B820F2048, AT32UC3C0512C, and M2S010 Microcontrollers in Low-Earth Orbit
Stefan Damkjar, I. R. Mann, D.G. Elliott
引用数: 9 • 2020
相关论文数: 1
Proton Beam Testing of SEU Sensitivity of M430FR5989SRGCREP, EFM32GG11B820F2048, AT32UC3C0512C, and M2S010 Microcontrollers in Low-Earth Orbit
Stefan Damkjar, I. R. Mann, D.G. Elliott
引用数: 9 • 2020