Automated Detection of Metal Surface Defects Using Waveguide-Fed Circular Aperture Probe

摘要

This paper presents an automated method for detecting metal surface defects using a Ka-band waveguide-fed circular aperture probe. The proposed technique demonstrates exceptional capabilities in identifying defects on metal surfaces, even in the presence of corrosion or paint coatings. Leveraging the circular aperture probe's high signal-to-noise ratio, the method is well-suited for non-destructive testing applications that require low-power input RF signals. Comparative analysis with a Ka-band waveguide-fed rectangular aperture probe reveals superior efficiency in defect detection for the circular aperture probe, particularly for defects larger than 5 mm, while maintaining excellent image quality. The automated defect detection process offers increased inspection speed, reduced human error, and potential for real-time monitoring. The versatility of the Ka-band circular aperture probe allows for broad applicability across various metallic materials and structures, making it ideal for industries such as aerospace, automotive, robotics, and civil engineering. Ongoing research focuses on optimizing the probe's design and exploring advanced imaging techniques to further enhance resolution capabilities. In conclusion, the proposed method showcases its efficacy and reliability, emphasizing its value in ensuring the safety and quality of critical engineering systems.