OTHER
Improved risk assessment model based on rough integrated clouds and ELECTRE-II method: an application to intelligent manufacturing process
Musavarah Sarwar, Wajeeha Gulzar, Samia Ashraf
- 发表年份
- 2023
- 引用次数
- 25
关键词
RandomnessVaguenessAmbiguityEntropy (arrow of time)ELECTREPairwise comparisonCloud computingRough setTOPSISComputer science
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