Focused ion beam
相关论文数: 14
顶级研究者
最高引用论文
Multi-Beam Scanning Electron Microscopy for High-Throughput Imaging in Connectomics Research
Anna Lena Eberle, D. Zeidler
引用数: 66 • 2018
Colour-tunable 50% strain sensor using surface-nanopatterning of soft materials via nanoimprinting with focused ion beam milling process
Ying‐Jun Quan, Min‐Soo Kim, Younggyun Kim, Sung‐Hoon Ahn
引用数: 26 • 2019
Smallest microhouse in the world, assembled on the facet of an optical fiber by origami and welded in the μRobotex nanofactory
Jean‐Yves Rauch, Olivier Lehmann, Patrick Rougeot, Joël Abadie, Joël Agnus, Miguel Ángel Suárez
引用数: 24 • 2018
Robotic fabrication of high-quality lamellae for aberration-corrected transmission electron microscopy
Hideyo Tsurusawa, N. Nakanishi, Kayoko Kawano, Yiqiang Chen, Mikhail Dutka, Brandon Van Leer, Teruyasu Mizoguchi
引用数: 18 • 2021
Less-invasive non-embedded cell cutting by nanomanipulation and vibrating nanoknife
Wanfeng Shang, Dengfeng Li, Haojian Lu, Toshio Fukuda, Yajing Shen
引用数: 18 • 2017
Development of a new, fully automated system for electron backscatter diffraction (EBSD)-based large volume three-dimensional microstructure mapping using serial sectioning by mechanical polishing, and its application to the analysis of special boundaries in 316L stainless steel
Shao‐Pu Tsai, Peter Joachim Konijnenberg, Iván Gónzalez, Samuel Hartke, Thomas Griffiths, Michael Herbig, Kaori Kawano-Miyata, Akira Taniyama, Naoyuki Sano, Stefan Zaefferer
引用数: 15 • 2022
A sub-micron metallic electrothermal gripper
Daniel Sang-Won Park, Arun K. Nallani, DonKyu Cha, Gil-Sik Lee, Moon J. Kim, George D. Skidmore, Jeong‐Bong Lee
引用数: 12 • 2009
Single cell adhesion force measurement for viability identification using nanorobotic manipulation system inside ESEM
Yajing Shen, Masahiro Nakajima, Seiji Kojima, Michio Homma, Toshio Fukuda
引用数: 10 • 2011
Cubical photonic structures by means of ion beam assisted robotic assembly
Waldemar Klauser, Sören Zimmermann, Malte Bartenwerfer, Sergej Fatikow
引用数: 7 • 2016
Individual nanowire handling for NEMS fabrication
Malte Bartenwerfer, Sergej Fatikow, Hongjiang Zeng, Tie Li, Yuelin Wang
引用数: 6 • 2012
Nanorobot-Based Handling and Transfer of Individual Silicon Nanowires
Malte Bartenwerfer, Sergej Fatikow
引用数: 6 • 2012
Nanoscale grid based positioning system for miniature instrumented robots
D. St-Jacques, Sylvain Martel, Tesca Fitzgerald
引用数: 6 • 2004
Measurement of MWCNT/Tungsten contact resistance by bridging CNT on two tungsten electrodes with two manipulators
Ning Yu, Masahiro Nakajima, Qing Shi, Masaru Takeuchi, Zhan Yang, Qiang Huang, Toshio Fukuda
引用数: 4 • 2015
Robotic nanowire handling for prototypic NEMS devices
Malte Bartenwerfer, Sergej Fatikow
引用数: 4 • 2013